Author: Alexander on 30-12-2016, 05:16
Scanning Transmission Electron Microscopy of Nanomaterials Basics of Imaging Analysis

Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis by Nobuo Tanaka
English | 2014 | ISBN: 184816789X | ISBN-13: 9781848167896 | 400 pages | PDF | 34,7 MB

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students.

This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.

(Buy premium account for maximum speed and resuming ability)

Dear visitor, you are browsing our website as Guest.
We strongly recommend you to register and login to view hidden contents.

Would you like to leave your comment? Please Login to your account to leave comments. Don't have an account? You can create a free account now.

Register | Forgot Password
Link 1
Designed by
Go Daddy Web Hosting! A completely unique experience - only  $1.99 / mo from Go Daddy! - 468x60